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Semiconductor, MEM, LCD, OLED, and Nano Device Yield

You just had 5,000 devices manufactured.
But 2,398 of them didn't meet spec....

Why?

That is the question Q-YIELD is designed to answer.

Whether you are ramping up production, solving a problematic yield bust, or debugging the manufacture of a new design, you need a powerful investigative tool in your armory. A manufacturing yield tool that

will rapidly search through production and test data and help you rapidly focus in on the right solution.

Yield is the most important variable in your production process, whether you are producing CMOS, LCDs, OLEDs, MEMs or other nano-devices. Yield management and yield optimization are vital. And an improvement in yield is an immediate improvement in your bottom line.

Without yield you have nothing.

When yield is low you need to find the reason. You need to examine your production data to determine the equipment or parameters at fault.

Using its proprietary data mining technology, Q-YIELD can help cut vital hours or days from the time required to solve expensive yield problems.

Q-YIELD is easy to use, does not require extensive training, and could be working on your problem in the next 24 hours.

Click here to learn more.

© Quadrillion Corporation 2014