Semiconductor, MEM, LCD, OLED, and Nano Device Yield
You just had 5,000 devices manufactured.
But 2,398 of them didn't meet spec....
That is the question Q-YIELD is designed to answer.
Whether you are ramping up production, solving a problematic
yield bust, or debugging the manufacture of a new design,
you need a powerful investigative tool in your armory. A manufacturing
yield tool that
will rapidly search through production and test data and help you
rapidly focus in on the right solution.
Yield is the most
important variable in your production
process, whether you are producing CMOS, LCDs, OLEDs, MEMs or
other nano-devices. Yield management and
yield optimization are vital.
And an improvement in yield
is an immediate
improvement in your bottom line.
Without yield you have nothing.
When yield is low you need to find the reason. You need to examine your
production data to determine the equipment or parameters at fault.
Using its proprietary data mining technology,
Q-YIELD can help cut vital hours or days
from the time required to solve expensive yield problems.
Q-YIELD is easy to use, does not require
extensive training, and could be working on your problem in the next 24 hours.
Click here to learn more.