Using Q-YIELD™ (Page
4 of 4)
Using Q-YIELD's quick look scatter plot facility, you look
at the effect of rcn and bvrcn on the number
of failures:
(Click image to enlarge)
Clearly there is something here that needs investigating.
Time to ask your engineers to look at the bvrcn/rcn parameter
tradeoff.
You sit back with your cup of coffee and reflect on the
eight hours you saved. Eight hours you didn't have to waste
examining 1,891 scatter plots... Eight hours where more
batches of faulty wafers would have been processed...
Perhaps there is something to be said for the Q-YIELD™
solution...
Why not evaluate Q-YIELD now using your own data?
Click here to
request a 10-day evaluation copy.
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